EXPERIMENTAL-STUDY OF BULK LIMITATION OF THE CURRENT IN HYDROGENATED AMORPHOUS-SILICON DIODES

被引:8
作者
CANNELLA, V [1 ]
MCGILL, J [1 ]
YANIV, Z [1 ]
SILVER, M [1 ]
机构
[1] UNIV N CAROLINA,DEPT PHYS & ASTRON,CHAPEL HILL,NC 27514
关键词
D O I
10.1016/0022-3093(85)90922-6
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
4
引用
收藏
页码:1421 / 1424
页数:4
相关论文
共 4 条
  • [1] Baron R., 1970, SEMICONDUCTORS SEMIM, V6, P201, DOI [10.1016/S0080-8784(08)62633-2, DOI 10.1016/S0080-8784(08)62633-2]
  • [2] Lampert M.A., 1970, PHYS B, DOI DOI 10.1088/0031-9112/21/12/031/PDF
  • [3] THE DENSITY OF STATES IN AMORPHOUS-SILICON DETERMINED BY SPACE-CHARGE-LIMITED CURRENT MEASUREMENTS
    MACKENZIE, KD
    LECOMBER, PG
    SPEAR, WE
    [J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1982, 46 (04): : 377 - 389
  • [4] OVSHINSKY SR, 1984, P S GLASS SCI TECHNO