WAVINESS EFFECTS IN RAY-TRACING OF REAL OPTICAL-SURFACES

被引：27

作者：

DELRIO, MS ^{[1
]}

MARCELLI, A ^{[1
]}

机构：

[1] IST NAZL FIS NUCL, LAB NAZL FRASCATI, I-00044 FRASCATI, ITALY

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1992年 / 319卷 / 1-3期

关键词：

D O I：

10.1016/0168-9002(92)90550-N

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Today ray-tracing calculations are playing an essential role in the design of synchrotron radiation beamlines. In particular, for the new generation of synchrotron radiation machines that will produce high brightness X-ray beams, the low emittance must be conserved along the beamline by choosing the best optical design. Quality of optical elements is limited by the technological manufacturing process, characterized by the values of roughness and waviness of the optical surfaces. Therefore a reliable description of an optical element is essential for having accurate results in ray-tracing simulations. We present here a model for introducing the waviness effect of real optics surfaces in ray-tracing calculations and also show some examples of simulated surfaces in comparison with real measured surfaces.

引用

页码：170 / 177

页数：8

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