COMPACT INTERFEROMETER FOR ACCURATE DETERMINATION OF OPTICAL-CONSTANTS OF THIN-FILMS

被引：11

作者：

SHAMIR, J ^{[1
]}

机构：

[1] TECHNION ISRAEL INST TECHNOL,FAC ELECT ENGN,HAIFA,ISRAEL

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1976年 / 9卷 / 06期

关键词：

D O I：

10.1088/0022-3735/9/6/022

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：499 / 503

页数：5

共 7 条

[1]

Born M., 1959, PRINCIPLES OPTICS

KWAAITAAL, T .

[3] HIGH PRECISION PATH DIFFERENCE MEASUREMENT [J].

LOVINS, GH .

APPLIED OPTICS, 1970, 9 (08) :1935-&

[4] HIGH-PRECISION POINTING INTERFEROMETER [J].

LOVINS, GH .

APPLIED OPTICS, 1964, 3 (07) :883-&

SAUNDERS, JB .

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION C-ENGINEERING AND INSTRUMENTATION, 1969, C 73 (1-2) :1-+

[6] A SIMPLE METHOD OF MEASURING VERY SMALL FRINGE SHIFTS [J].

SHAMIR, J ;

FOX, R ;

LIPSON, SG .

APPLIED OPTICS, 1969, 8 (01) :103-&

SHAMIR, J ;

GRAFF, P .

APPLIED OPTICS, 1975, 14 (12) :3053-3056