ELECTRON-TRANSPORT PROPERTIES OF THIN COPPER-FILMS .1.

被引：75

作者：

SURI, R ^{[1
]}

THAKOOR, AP ^{[1
]}

CHOPRA, KL ^{[1
]}

机构：

[1] INDIAN INST TECHNOL,DEPT PHYS,NEW DELHI 29,INDIA

来源：

JOURNAL OF APPLIED PHYSICS | 1975年 / 46卷 / 06期

关键词：

D O I：

10.1063/1.321934

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2574 / 2582

页数：9

共 19 条

[1]

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[2]

BONFIGLIOLI P, 1956, J APPL PHYS, V27, P201

[3]

CAMPBELL DS, 1966, USE THIN FILMS PHYSI

[4]

Chopra K. L., 1969, THIN FILM PHENOMENA

[5] HALL EFFECT IN THIN METAL FILMS [J].

CHOPRA, KL ;

BAHL, SK .

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[6] HALL-EFFEKTS UND LEITFAHIGKEITSMESSUNGEN AN DUNNEN KALIUMSCHICHTEN [J].

CIRKLER, W .

ZEITSCHRIFT FUR PHYSIK, 1957, 147 (04) :481-498

[7] GEOMETRICAL SIZE EFFECT IN RESISTIVITY AND HALL COEFFICIENT IN SINGLE-CRYSTAL SILVER FILMS [J].

DUGGAL, VP ;

NAGPAL, VP .

JOURNAL OF APPLIED PHYSICS, 1971, 42 (11) :4500-&

[8] TEMPERATURE COEFFICIENT OF RESISTIVITY OF POLYCRYSTALLINE FILMS [J].

JOGLEKAR, AV ;

KAREKAR, RN ;

SATHIANANDAN, K .

PHYSICS LETTERS A, 1973, A 45 (05) :391-392

[9]

KANER EA, 1969, FIZ TVERD TELA+, V10, P2401

[10]

KINBARA H, 1972, THIN SOLID FILMS, V12, P63

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