DISPLACEMENT ENERGY THRESHOLD FOR NE+ IRRADIATION OF GRAPHITE

被引:56
作者
STEFFEN, HJ
MARTON, D
RABALAIS, JW
机构
[1] Department of Chemistry, University of Houston, Houston
关键词
D O I
10.1103/PhysRevLett.68.1726
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
A method for direct determination of the threshold energy (E(d)) for displacing atoms by low-energy ion irradiation to form residual point defects is described, The method is demonstrated for Ne+ irradiation of graphite. The damage induced by low Ne+ doses (< 2 x 10(15) ions/cm2) was quantified by means of a defect-sensitive feature in the Auger electron spectrum. The defect production rates at different Ne+ energies yield a displacement energy of E(d) = 35.3 +/- 1 eV. This result provides new insight into the elementary collision processes leading to point defect creation.
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页码:1726 / 1729
页数:4
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