ON THE FORMATION AND EMISSION OF POLYATOMIC SECONDARY IONS FROM METAL-SALTS

[1] BARLAK TM, J PHYS CHEM

[2] BENNINGHOVEN A, 1979, SECONDARY ION MASS S, V2

[3] EXPERIMENTAL AND THEORETICAL APPROACHES TO THE IONIZATION PROCESS IN SECONDARY-ION EMISSION [J]. SURFACE SCIENCE, 1979, 90 (02) : 495 - 547

[4] EFFECT OF CLUSTER SURFACE ENERGIES ON SECONDARY-ION-INTENSITY DISTRIBUTIONS FROM IONIC-CRYSTALS [J]. PHYSICAL REVIEW LETTERS, 1981, 47 (15) : 1046 - 1049

[5] HIGH-PERFORMANCE SECONDARY ION MASS-SPECTROMETER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (12) : 1685 - 1689

[6] MOLECULAR SECONDARY ION MASS-SPECTROMETRY (SIMS) [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03): : 737 - 747

[7] MOLECULAR SECONDARY ION MASS-SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1980, 52 (04) : A557 - &

[8] SIMS MOLECULAR CLUSTER INTENSITIES OF INORGANIC SALTS CONTAINING SULFUR AND NITROGEN OXYANIONS [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 37 (01): : 49 - 65

[9] GARRISON BJ, 1980, J AM CHEM SOC, V102, P6554

[10] THE USE OF SPUTTERING AS A METHOD FOR ANALYZING SURFACE CHEMICAL-COMPOSITION - A MOLECULAR-DYNAMICS STUDY [J]. SURFACE SCIENCE, 1981, 105 (01) : 225 - 239

[1] BARLAK TM, J PHYS CHEM

[2] BENNINGHOVEN A, 1979, SECONDARY ION MASS S, V2

[3] EXPERIMENTAL AND THEORETICAL APPROACHES TO THE IONIZATION PROCESS IN SECONDARY-ION EMISSION [J]. SURFACE SCIENCE, 1979, 90 (02) : 495 - 547

[4] EFFECT OF CLUSTER SURFACE ENERGIES ON SECONDARY-ION-INTENSITY DISTRIBUTIONS FROM IONIC-CRYSTALS [J]. PHYSICAL REVIEW LETTERS, 1981, 47 (15) : 1046 - 1049

[5] HIGH-PERFORMANCE SECONDARY ION MASS-SPECTROMETER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (12) : 1685 - 1689

[6] MOLECULAR SECONDARY ION MASS-SPECTROMETRY (SIMS) [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03): : 737 - 747

[7] MOLECULAR SECONDARY ION MASS-SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1980, 52 (04) : A557 - &

[8] SIMS MOLECULAR CLUSTER INTENSITIES OF INORGANIC SALTS CONTAINING SULFUR AND NITROGEN OXYANIONS [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 37 (01): : 49 - 65

[9] GARRISON BJ, 1980, J AM CHEM SOC, V102, P6554

[10] THE USE OF SPUTTERING AS A METHOD FOR ANALYZING SURFACE CHEMICAL-COMPOSITION - A MOLECULAR-DYNAMICS STUDY [J]. SURFACE SCIENCE, 1981, 105 (01) : 225 - 239