X-RAY DETERMINATION OF THE MOLECULAR TILT AND LAYER FLUCTUATION PROFILES OF FREELY SUSPENDED LIQUID-CRYSTAL FILMS

被引：94

作者：

TWEET, DJ ^{[1
]}

HOLYST, R ^{[1
]}

SWANSON, BD ^{[1
]}

STRAGIER, H ^{[1
]}

SORENSEN, LB ^{[1
]}

机构：

[1] POLISH ACAD SCI,INST PHYS CHEM,DEPT 3,PL-01224 WARSAW,POLAND

来源：

PHYSICAL REVIEW LETTERS | 1990年 / 65卷 / 17期

关键词：

D O I：

10.1103/PhysRevLett.65.2157

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

X-ray diffraction has been used to study the interlayer structure of fluid freely suspended liquid-crystal films versus film thickness. The observed scattering is described extremely well by a simple interlayer density model based on predicted layer fluctuation is and tilt angle i profiles. The diffraction data determine the individual is to about ±0.1, and the layer-fluctuation profiles calculated for the hydrodynamic fluctuations agree to this precision. The tilt profiles calculated using a simple elastic theory are also in excellent agreement with the data. © 1990 The American Physical Society.

引用

页码：2157 / 2160

页数：4

共 16 条

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