CURRENT NOISE MEASUREMENTS IN CONTINUOUS METAL THIN-FILMS

被引：9

作者：

CELASCO, M ^{[1
]}

FIORILLO, F ^{[1
]}

机构：

[1] CNR,IST ELETTROTECNICO NAZL GALILEO FERRARIS,GRP NAZL STRUTTURA MAT,UR 24,10125 TURIN,ITALY

来源：

关键词：

D O I：

10.1063/1.88096

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：211 / 212

页数：2

共 8 条

[1] CURRENT NOISE ON AU THIN FILMS
BERGERO, F
MAZZETTI, P
MONTALENTI, G
[J]. NUOVO CIMENTO B, 1968, 56 (01): : 62 - +
[2] Bernamont J., 1937, ANN PHYS-BERLIN, V11, P71, DOI [10.1051/anphys/193711070071, DOI 10.1051/ANPHYS/193711070071]
[3] Bittel H., 1956, Z ANGEW PHYS, V8, P417
[4] EFFET DE SCINTILLATION ET STRUCTURE DE COUCHES MINCES METALLIQUES
BOREL, JP
[J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1956, 17 (03): : 224 - 229
[5] Spontaneous resistance fluctuations in carbon microphones and other granular resistances
Christensen, CJ
Pearson, GL
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1936, 15 : 197 - 223
[6] 1/F-NOISE IN CONTINUOUS THIN GOLD FILMS
HOOGE, FN
HOPPENBROUWERS, AM
[J]. PHYSICA, 1969, 45 (03): : 386 - +
[7] MECHANISM OF NOISE FORMATION IN ELECTRIC CONDUCTION IN THIN METAL-FILMS
MAZZETTI, P
STEPANESCU, A
[J]. THIN SOLID FILMS, 1972, 13 (01) : 67 - +
[8] SCREENING OF METAL FILM DEFECTS BY CURRENT NOISE MEASUREMENTS
VOSSEN, JL
[J]. APPLIED PHYSICS LETTERS, 1973, 23 (06) : 287 - 289