AN X-RAY FOURIER LINE-SHAPE ANALYSIS OF HEXAGONAL TELLURIUM-FILMS .3. VACUUM EVAPORATED ONTO AIR-CLEAVED MICA SUBSTRATES AT LOW-TEMPERATURE (133 K)

被引:1
作者
CHATTERJEE, E
SENGUPTA, SP
机构
关键词
D O I
10.1016/0040-6090(86)90091-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:87 / 98
页数:12
相关论文
共 7 条
[1]  
CHATTERJEE E, 1985, THIN SOLID FILMS, V122, P73
[2]   X-RAY FOURIER LINE-SHAPE ANALYSIS OF HEXAGONAL TELLURIUM-FILMS VACUUM-EVAPORATED UNDER NORMAL INCIDENCE [J].
NANDI, RK ;
SENGUPTA, SP .
THIN SOLID FILMS, 1979, 59 (03) :295-311
[3]   RESIDUAL-STRESS MEASUREMENTS IN HEXAGONAL ZINC FILMS FROM X-RAY PEAK SHIFT ANALYSIS [J].
NANDI, RK ;
GUPTA, SPS .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1977, 10 (11) :1479-1485
[4]   EPITAXIAL AND AMORPHOUS-CRYSTALLINE PHASE-TRANSITION GROWTH OF EVAPORATED TE FILMS [J].
OKUYAMA, K ;
CHIBA, M ;
KUMAGAI, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1979, 18 (03) :507-514
[5]   X-RAY-DIFFRACTION STUDY OF MICROSTRUCTURE OF HEXAGONAL CLOSE-PACKED ZINC FILMS .1. FILMS VACUUM EVAPORATED AT OBLIQUE-INCIDENCE [J].
SEN, S ;
NANDI, RK ;
SENGUPTA, SP .
THIN SOLID FILMS, 1978, 48 (01) :1-16
[6]   STRUCTURE AND GROWTH OF ORIENTED TELLURIUM THIN FILMS [J].
WEIDMANN, EJ ;
ANDERSON, JC .
THIN SOLID FILMS, 1971, 7 (3-4) :265-&
[7]  
1960, POWDER DIFFRACTION F