WEAK-BEAM METHOD IN ELECTRON-MICROSCOPY - .1. THEORETICAL ANALYSIS

被引：14

作者：

SANDSTRO.R ^{[1
]}

机构：

[1] ROY INST TECHNOL, DEPT THEORET PHYS, STOCKHOLM, SWEDEN

来源：

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1973年 / 18卷 / 02期

关键词：

D O I：

10.1002/pssa.2210180226

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：639 / 649

页数：11

共 15 条

[1]

COCKAYNE DJ, 1972, Z NATURFORSCH PT A, VA 27, P452

[2] INVESTIGATIONS OF DISLOCATION STRAIN FIELDS USING WEAK BEAMS [J].

COCKAYNE, DJ ;

RAY, ILF ;

WHELAN, MJ .

PHILOSOPHICAL MAGAZINE, 1969, 20 (168) :1265-&

[3] MEASUREMENT OF STACKING-FAULT ENERGIES OF PURE FACE-CENTRED CUBIC METALS [J].

COCKAYNE, DJ ;

JENKINS, ML ;

RAY, ILF .

PHILOSOPHICAL MAGAZINE, 1971, 24 (192) :1383-&

[4]

COCKAYNE DJH, 1970, 7 P INT C EL MICR, V2, P321

[5]

COCKAYNE DJH, 1971, 25 P ANN M EMAG

[6]

HIRSCH PB, 1965, ELECTRON MICROSCOPY

[7] COLUMN APPROXIMATION EFFECTS IN HIGH RESOLUTION ELECTRON MICROSCOPY USING WEAK DIFFRACTED BEAMS [J].

HOWIE, A ;

SWORN, CH .

PHILOSOPHICAL MAGAZINE, 1970, 22 (178) :861-&

[8]

HUMBLE P, 1970, MODERN DIFFRACTION I

[9] MEASUREMENT OF STACKING-FAULT ENERGY OF GOLD USING WEAK-BEAM TECHNIQUE OF ELECTRON-MICROSCOPY [J].

JENKINS, ML .

PHILOSOPHICAL MAGAZINE, 1972, 26 (03) :747-&

[10] DISSOCIATION OF DISLOCATIONS IN SILICON [J].

RAY, ILF ;

COCKAYNE, DJ .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1971, 325 (1563) :543-&

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