COMPACT FLUORESCENCE X-RAY-DETECTOR FOR SURFACE EXAFS AND X-RAY STANDING WAVE MEASUREMENTS

被引：68

作者：

FUNABASHI, M

OHTA, T

YOKOYAMA, T

KITAJIMA, Y

KURODA, H

机构：

[1] HIROSHIMA UNIV,FAC SCI,DEPT MAT SCI,HIROSHIMA 730,JAPAN

[2] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN

[3] UNIV TOKYO,FAC SCI,DEPT CHEM,BUNKYO KU,TOKYO 113,JAPAN

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 07期

关键词：

D O I：

10.1063/1.1140713

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：2505 / 2508

页数：4

共 10 条

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[2] X-RAY-FLUORESCENCE PROPORTIONAL COUNTER FOR SEXAFS STUDIES OF LOW-Z ADSORBATES
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[3] A POSSIBLE USE OF THE SOFT-X-RAY STANDING WAVE METHOD FOR SURFACE AND INTERFACE STRUCTURE-ANALYSIS
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[4] DESIGN AND PERFORMANCE OF A UHV COMPATIBLE SOFT-X-RAY DOUBLE CRYSTAL MONOCHROMATOR AT THE PHOTON FACTORY
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[5] OHTA T, 1985, JPN J APPL PHYS, V24, P1475
[6] FLUORESCENCE-DETECTED X-RAY ABSORPTION-SPECTROSCOPY APPLIED TO STRUCTURAL CHARACTERIZATION OF VERY THIN-FILMS - ION-BEAM-INDUCED MODIFICATION OF THIN NI LAYERS ON SI(100)
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[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (05): : 610 - 619
[7] STOHR J, 1988, XRAY ABSORPTION PRIN
[8] A SIMPLE X-RAY STANDING WAVE TECHNIQUE FOR SURFACE-STRUCTURE DETERMINATION - THEORY AND AN APPLICATION
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[J]. SURFACE SCIENCE, 1988, 195 (1-2) : 237 - 254
[9] YOKOYAMA T, 1988, IN PRESS PHYSICA B
[10] FLUORESCENCE YIELD NEAR-EDGE X-RAY ABSORPTION-SPECTROSCOPY UNDER ATMOSPHERIC CONDITIONS - CO AND H-2 COADSORPTION ON NI(100) AT PRESSURES BETWEEN 10(-9) AND 0.1 TORR
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[J]. SURFACE SCIENCE, 1988, 194 (1-2) : 205 - 216

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