SURFACE-PLASMON MICROSCOPIC CHARACTERIZATION OF EXTERNAL SURFACES

被引：16

作者：

HICKEL, W

ROTHENHAUSLER, B

KNOLL, W

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1989年 / 66卷 / 10期

关键词：

D O I：

10.1063/1.344468

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：4832 / 4836

页数：5

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