THEORY OF SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY - RESOLUTION, IMAGE AND FIELD STATES, AND THIN OXIDE LAYERS

被引：43

作者：

GARCIA, N

机构：

来源：

IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1986年 / 30卷 / 05期

关键词：

D O I：

10.1147/rd.305.0533

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

收藏

页码：533 / 542

页数：10

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共 43 条

[1] THEORY OF SCANNING TUNNELING MICROSCOPY METHODS AND APPROXIMATIONS
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[2] ELECTRON INTERFEROMETRY AT CRYSTAL-SURFACES
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[3] ELECTRON METAL-SURFACE INTERACTION POTENTIAL WITH VACUUM TUNNELING - OBSERVATION OF THE IMAGE FORCE
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[J]. PHYSICAL REVIEW B, 1984, 30 (08): : 4816 - 4818
[4] TUNNELING SPECTROSCOPY AND INVERSE PHOTOEMISSION - IMAGE AND FIELD STATES
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[J]. PHYSICAL REVIEW LETTERS, 1985, 55 (09) : 991 - 994
[5] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE
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[J]. PHYSICAL REVIEW LETTERS, 1983, 50 (02) : 120 - 123
[6] TUNNELING THROUGH A CONTROLLABLE VACUUM GAP
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[J]. APPLIED PHYSICS LETTERS, 1982, 40 (02) : 178 - 180
[7] BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[8] GENERALIZED MANY-CHANNEL CONDUCTANCE FORMULA WITH APPLICATION TO SMALL RINGS
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[J]. PHYSICAL REVIEW B, 1985, 31 (10): : 6207 - 6215
[9] TRAVERSAL TIME FOR TUNNELING
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[J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) : 451 - 454
[10] TRAVERSAL TIME FOR TUNNELING
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[J]. PHYSICAL REVIEW LETTERS, 1982, 49 (23) : 1739 - 1742

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