SCANNING TUNNELING MICROSCOPY

被引：506

作者：

HANSMA, PK ^{[1
]}

TERSOFF, J ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 61卷 / 02期

关键词：

D O I：

10.1063/1.338189

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：R1 / R23

页数：23

共 108 条

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