PHOTODIODE NONLINEARITY MEASUREMENT WITH AN INTENSITY STABILIZED LASER AS A RADIATION SOURCE

被引：37

作者：

FISCHER, J

FU, L

机构：

[1] Physikalisch-Technische Bundesanstalt, Institut Berlin, Berlin, 1000

来源：

APPLIED OPTICS | 1993年 / 32卷 / 22期

关键词：

RADIOMETRY; NONLINEARITY OF PHOTODIODES;

D O I：

10.1364/AO.32.004187

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A new facility for the nonlinearity measurement of the spectral responsivity of photodiodes has been developed by using an intensity stabilized laser as radiation source. This device enables an automated measurement of the photodiode nonlinearity from the nanowatt to the milliwatt radiant power range at wavelengths between 250 and 800 nm with uncertainties of better than 0.01% in the visible and better than 0.05% in the UV at the 1sigma level.

引用

页码：4187 / 4190

页数：4

共 9 条

[1] PRESENT STATE OF THE DETERMINATION OF THERMODYNAMIC TEMPERATURES NEAR THE FREEZING-POINT OF SILVER BY ABSOLUTE CRYORADIOMETRY
FISCHER, J
LEI, F
STOCK, M
[J]. METROLOGIA, 1991, 28 (03) : 243 - 246
[2] COMPARISON OF 2 CRYOGENIC RADIOMETERS BY DETERMINING THE ABSOLUTE SPECTRAL RESPONSIVITY OF SILICON PHOTODIODES WITH AN UNCERTAINTY OF 0.02-PERCENT
FOX, NP
MARTIN, JE
[J]. APPLIED OPTICS, 1990, 29 (31): : 4686 - 4693
[3] SPECTRAL NONLINEARITY CHARACTERISTICS OF LOW-NOISE SILICON DETECTORS AND THEIR APPLICATION TO ACCURATE MEASUREMENTS OF RADIANT-FLUX RATIOS
JUNG, HJ
[J]. METROLOGIA, 1979, 15 (04) : 173 - 181
[4] KOHLER R, 1990, APPL OPTICS, V29, P4212, DOI 10.1364/AO.29.004212
[5] PRINCIPLE AND APPLICATION OF DIFFERENTIAL SPECTRORADIOMETRY
METZDORF, J
MOLLER, W
WITTCHEN, T
HUNERHOFF, D
[J]. METROLOGIA, 1991, 28 (03) : 247 - 250
[6] AUTOMATED RADIOMETRIC LINEARITY TESTER
SAUNDERS, RD
SHUMAKER, JB
[J]. APPLIED OPTICS, 1984, 23 (20): : 3504 - 3506
[7] SCHAEFER B, 1978, LEHRBUCH EXPERIMENTA, V3, P469
[8] SI-PHOTODIODE SPECTRAL NONLINEARITY IN THE INFRARED
STOCK, KD
[J]. APPLIED OPTICS, 1986, 25 (06): : 830 - 832
[9] 1988, SPECTRA PHYSICS MODE

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