SI-PHOTODIODE SPECTRAL NONLINEARITY IN THE INFRARED

被引：21

作者：

STOCK, KD

机构：

来源：

APPLIED OPTICS | 1986年 / 25卷 / 06期

关键词：

D O I：

10.1364/AO.25.000830

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：830 / 832

页数：3

共 13 条

[1] BISCHOFF K, 1961, Z INSTRUMENTENKD, V69, P143
[2] MULTI-DECADE LINEARITY MEASUREMENTS ON SI PHOTO-DIODES
BUDDE, W
[J]. APPLIED OPTICS, 1979, 18 (10): : 1555 - 1558
[3] SPECTRAL RESPONSE SELF-CALIBRATION AND INTERPOLATION OF SILICON PHOTO-DIODES
GEIST, J
ZALEWSKI, EF
SCHAEFER, AR
[J]. APPLIED OPTICS, 1980, 19 (22): : 3795 - 3799
[4] PHYSICS OF PHOTON-FLUX MEASUREMENTS WITH SILICON PHOTO-DIODES
GEIST, J
GLADDEN, WK
ZALEWSKI, EF
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1982, 72 (08) : 1068 - 1075
[5] SPECTRAL NONLINEARITY CHARACTERISTICS OF LOW-NOISE SILICON DETECTORS AND THEIR APPLICATION TO ACCURATE MEASUREMENTS OF RADIANT-FLUX RATIOS
JUNG, HJ
[J]. METROLOGIA, 1979, 15 (04) : 173 - 181
[6] MOSTL K, 1982, PTB-MITT, V92, P11
[7] MOSTL K, 1982, PTB162 JAHR BER
[8] RUNYAN WR, 1967, SMU8313 SO METH U RE
[9] SILICON DETECTOR NONLINEARITY AND RELATED EFFECTS
SCHAEFER, AR
ZALEWSKI, EF
GEIST, J
[J]. APPLIED OPTICS, 1983, 22 (08): : 1232 - 1236
[10] STOCK KD, 1985, OPTIK, V71, P137