CHARGE-COUPLED AREA IMAGE SENSOR USING 3 LEVELS OF POLYSILICON

[1] COMPUTER MODELING OF CHARGE-COUPLED DEVICE CHARACTERISTICS [J]. BELL SYSTEM TECHNICAL JOURNAL, 1972, 51 (03): : 705 - +

[2] BERTRAM WJ, 1974, IEEE T ELECTRON DEV, VED21

[3] BERTRAM WJ, 1972, DIG IEEE INTERCON, P292

[4] CHARGE COUPLED SEMICONDUCTOR DEVICES [J]. BELL SYSTEM TECHNICAL JOURNAL, 1970, 49 (04): : 587 - +

[5] ESSER LJM, 1973, TECH DIGEST, P17

[6] HELM GD, 1969, DEC P CAM S BELL LAB, P115

[7] KIM CK, 1972, NEREM 72 REC, P161

[8] MORRIS FR, UNPUBLISHED

[9] EXPERIMENTAL INVESTIGATION OF A LINEAR 500-ELEMENT 3-PHASE CHARGE-COUPLED DEVICE [J]. BELL SYSTEM TECHNICAL JOURNAL, 1974, 53 (04): : 581 - 610

[10] BLOOMING SUPPRESSION IN CHARGE COUPLED AREA IMAGING DEVICES [J]. BELL SYSTEM TECHNICAL JOURNAL, 1972, 51 (08): : 1923 - +

[1] COMPUTER MODELING OF CHARGE-COUPLED DEVICE CHARACTERISTICS [J]. BELL SYSTEM TECHNICAL JOURNAL, 1972, 51 (03): : 705 - +

[2] BERTRAM WJ, 1974, IEEE T ELECTRON DEV, VED21

[3] BERTRAM WJ, 1972, DIG IEEE INTERCON, P292

[4] CHARGE COUPLED SEMICONDUCTOR DEVICES [J]. BELL SYSTEM TECHNICAL JOURNAL, 1970, 49 (04): : 587 - +

[5] ESSER LJM, 1973, TECH DIGEST, P17

[6] HELM GD, 1969, DEC P CAM S BELL LAB, P115

[7] KIM CK, 1972, NEREM 72 REC, P161

[8] MORRIS FR, UNPUBLISHED

[9] EXPERIMENTAL INVESTIGATION OF A LINEAR 500-ELEMENT 3-PHASE CHARGE-COUPLED DEVICE [J]. BELL SYSTEM TECHNICAL JOURNAL, 1974, 53 (04): : 581 - 610

[10] BLOOMING SUPPRESSION IN CHARGE COUPLED AREA IMAGING DEVICES [J]. BELL SYSTEM TECHNICAL JOURNAL, 1972, 51 (08): : 1923 - +