CHARGE COUPLED SEMICONDUCTOR DEVICES

[1] EXPERIMENTAL VERIFICATION OF CHARGE COUPLED DEVICE CONCEPT [J]. BELL SYSTEM TECHNICAL JOURNAL, 1970, 49 (04): : 593 - +

[2] INFLUENCE OF BULK AND SURFACE PROPERTIES ON IMAGE SENSING SILICON DIODE ARRAYS [J]. BELL SYSTEM TECHNICAL JOURNAL, 1968, 47 (09): : 1827 - +

[3] GOETZBERGER A, 1966, APPL PHYS LETT, V9, P444

[4] GORDON EI, PRIVATE COMMUNICATIO

[5] ON DETERMINATION OF MINORITY CARRIER LIFETIME FROM TRANSIENT RESPONSE OF AN MOS CAPACITOR [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1967, ED14 (11) : 781 - +

[6] MINORITY CARRIER LIFETIME DETERMINATION FROM INVERSION LAYER TRANSIENT RESPONSE [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1967, ED14 (11) : 785 - +

[1] EXPERIMENTAL VERIFICATION OF CHARGE COUPLED DEVICE CONCEPT [J]. BELL SYSTEM TECHNICAL JOURNAL, 1970, 49 (04): : 593 - +

[2] INFLUENCE OF BULK AND SURFACE PROPERTIES ON IMAGE SENSING SILICON DIODE ARRAYS [J]. BELL SYSTEM TECHNICAL JOURNAL, 1968, 47 (09): : 1827 - +

[3] GOETZBERGER A, 1966, APPL PHYS LETT, V9, P444

[4] GORDON EI, PRIVATE COMMUNICATIO

[5] ON DETERMINATION OF MINORITY CARRIER LIFETIME FROM TRANSIENT RESPONSE OF AN MOS CAPACITOR [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1967, ED14 (11) : 781 - +

[6] MINORITY CARRIER LIFETIME DETERMINATION FROM INVERSION LAYER TRANSIENT RESPONSE [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1967, ED14 (11) : 785 - +