INFLUENCE OF BULK AND SURFACE PROPERTIES ON IMAGE SENSING SILICON DIODE ARRAYS

被引：63

作者：

BUCK, TM

CASEY, HC

DALTON, JV

YAMIN, M

机构：

来源：

BELL SYSTEM TECHNICAL JOURNAL | 1968年 / 47卷 / 09期

关键词：

D O I：

10.1002/j.1538-7305.1968.tb01092.x

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1827 / +

页数：1

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[9]

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[10]

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