THERMAL-ANALYSIS OF LASER DAMAGE IN THIN-FILM PHOTOCONDUCTORS

被引:15
作者
KRUER, M [1 ]
ESTEROWITZ, L [1 ]
BARTOLI, F [1 ]
ALLEN, R [1 ]
机构
[1] USN,RES LAB,WASHINGTON,DC 20375
关键词
D O I
10.1063/1.323063
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:2867 / 2874
页数:8
相关论文
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