MULTIPLE-CRYSTAL X-RAY TOPOGRAPHIC CHARACTERIZATION OF PERIODICALLY DOMAIN-INVERTED KTIOPO4 CRYSTAL

被引：12

作者：

HU, ZW

THOMAS, PA

GUPTA, MC

RISK, WP

机构：

[1] UNIV OXFORD,CLARENDON LAB,OXFORD OX1 3PU,ENGLAND

[2] EASTMAN KODAK CO,RES LABS,ROCHESTER,NY 14650

[3] IBM CORP,ALMADEN RES CTR,DIV RES,SAN JOSE,CA 95120

来源：

APPLIED PHYSICS LETTERS | 1995年 / 66卷 / 01期

关键词：

D O I：

10.1063/1.114165

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A periodically domain-inverted KTiOPO4 crystal has been characterized for the first time by multiple-crystal multiple-reflection x-ray topography. The striation contrast within the domain-inverted regions has been revealed in high strain-sensitivity reflection topographs. The origin of formation of the striation contrast and the mechanism of domain inversion in KTiOPO4 are discussed in terms of the structural characteristics of KTiOPO4.© 1995 American Institute of Physics.

引用

页码：13 / 15

页数：3

共 24 条

[1] INTERACTIONS BETWEEN LIGHT WAVES IN A NONLINEAR DIELECTRIC [J].