A HIGH-RESOLUTION MULTIPLE-CRYSTAL MULTIPLE-REFLECTION DIFFRACTOMETER

[1] VERY HIGH PRECISION X-RAY DIFFRACTION [J]. NATURE, 1966, 210 (5037) : 720 - &

[2] CHARACTERIZATION OF THIN-LAYERS ON PERFECT CRYSTALS WITH A MULTIPURPOSE HIGH-RESOLUTION X-RAY DIFFRACTOMETER [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (02): : 338 - 345

[3] MULTIPLE BRAGG REFLECTION MONOCHROMATORS FOR SYNCHROTRON-X RADIATION [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (10): : 823 - 829

[4] TAILLESS X-RAY SINGLE-CRYSTAL REFLECTION CURVES OBTAINED BY MULTIPLE REFLECTION - (SI GE CRYSTALS - E/T) [J]. APPLIED PHYSICS LETTERS, 1965, 7 (09) : 238 - &

[5] COMPTON AH, 1935, XRAYS THEORY EXPERIM, P709

[6] X-RAY-SCATTERING STUDIES OF THIN-FILMS AND SURFACES - THERMAL OXIDES ON SILICON [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1987, 20 (01) : 61 - 68

[7] RESOLUTION FUNCTION OF AN X-RAY TRIPLE-CRYSTAL DIFFRACTOMETER [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1987, 43 : 825 - 836

[8] Theory of the use of more than two successive x-ray crystal reflections to obtain increased resolving power [J]. PHYSICAL REVIEW, 1937, 52 (08): : 0872 - 0883

[9] Fewster P F, 1987, NATO ASI SER B-PHYS, V163, P417

[10] COMPOSITION AND LATTICE-MISMATCH MEASUREMENT OF THIN SEMICONDUCTOR LAYERS BY X-RAY-DIFFRACTION [J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (10) : 4154 - 4158

[1] VERY HIGH PRECISION X-RAY DIFFRACTION [J]. NATURE, 1966, 210 (5037) : 720 - &

[2] CHARACTERIZATION OF THIN-LAYERS ON PERFECT CRYSTALS WITH A MULTIPURPOSE HIGH-RESOLUTION X-RAY DIFFRACTOMETER [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (02): : 338 - 345

[3] MULTIPLE BRAGG REFLECTION MONOCHROMATORS FOR SYNCHROTRON-X RADIATION [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (10): : 823 - 829

[4] TAILLESS X-RAY SINGLE-CRYSTAL REFLECTION CURVES OBTAINED BY MULTIPLE REFLECTION - (SI GE CRYSTALS - E/T) [J]. APPLIED PHYSICS LETTERS, 1965, 7 (09) : 238 - &

[5] COMPTON AH, 1935, XRAYS THEORY EXPERIM, P709

[6] X-RAY-SCATTERING STUDIES OF THIN-FILMS AND SURFACES - THERMAL OXIDES ON SILICON [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1987, 20 (01) : 61 - 68

[7] RESOLUTION FUNCTION OF AN X-RAY TRIPLE-CRYSTAL DIFFRACTOMETER [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1987, 43 : 825 - 836

[8] Theory of the use of more than two successive x-ray crystal reflections to obtain increased resolving power [J]. PHYSICAL REVIEW, 1937, 52 (08): : 0872 - 0883

[9] Fewster P F, 1987, NATO ASI SER B-PHYS, V163, P417

[10] COMPOSITION AND LATTICE-MISMATCH MEASUREMENT OF THIN SEMICONDUCTOR LAYERS BY X-RAY-DIFFRACTION [J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (10) : 4154 - 4158