RESOLUTION FUNCTION OF AN X-RAY TRIPLE-CRYSTAL DIFFRACTOMETER

被引：49

作者：

COWLEY, RA

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1987年 / 43卷

关键词：

D O I：

10.1107/S0108767387098453

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：825 / 836

页数：12

共 13 条

[1] X-RAY-SCATTERING FROM CRITICAL FLUCTUATIONS AND DOMAIN-WALLS IN KDP AND DKDP
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[2] SCATTERING OF X-RAYS FROM CRYSTAL-SURFACES
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[3] LORENTZ FACTORS FOR LARGE-MOSAIC CRYSTALS
AXE, JD
HASTINGS, JB
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1983, 39 (JUL): : 593 - 594
[4] BJERRUMMOLLER H, 1970, INSTRUMENTATION NEUT, P49
[5] DERIVATION AND EXPERIMENTAL VERIFICATION OF NORMALIZED RESOLUTION FUNCTION FOR INELASTIC NEUTRON-SCATTERING
CHESSER, NJ
AXE, JD
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1973, A 29 (MAR1): : 160 - 169
[6] RESOLUTION FUNCTION IN NEUTRON DIFFRACTOMETRY .I. RESOLUTION FUNCTION OF A NEUTRON DIFFRACTOMETER AND ITS APPLICATION TO PHONON MEASUREMENTS
COOPER, MJ
NATHANS, R
[J]. ACTA CRYSTALLOGRAPHICA, 1967, 23 : 357 - &
[7] X-RAY-SCATTERING STUDIES OF THIN-FILMS AND SURFACES - THERMAL OXIDES ON SILICON
COWLEY, RA
RYAN, TW
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1987, 20 (01) : 61 - 68
[8] THE RESOLUTION FUNCTION OF A PERFECT-CRYSTAL 3-AXIS X-RAY SPECTROMETER
PYNN, R
FUJII, Y
SHIRANE, G
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1983, 39 (JAN): : 38 - 46
[9] ORDERING AT SI(111)/A-SI AND SI(111)/SIO2 INTERFACES
ROBINSON, IK
WASKIEWICZ, WK
TUNG, RT
BOHR, J
[J]. PHYSICAL REVIEW LETTERS, 1986, 57 (21) : 2714 - 2717
[10] CRYSTAL TRUNCATION RODS AND SURFACE-ROUGHNESS
ROBINSON, IK
[J]. PHYSICAL REVIEW B, 1986, 33 (06): : 3830 - 3836

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