THE GENERATION OF FLAWS IN ANODIC BARRIER-TYPE FILMS ON ALUMINUM

被引:28
作者
SHIMIZU, K
THOMPSON, GE
WOOD, GC
机构
关键词
D O I
10.1016/0013-4686(82)80010-8
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:245 / 250
页数:6
相关论文
共 21 条
[1]  
Cooke W.E., 1962, PLATING, V49, P1157
[2]  
COTE J, 1970, PLATING, V47, P484
[3]   PORES IN TANTALUM OXIDE FILMS AND THEIR INFLUENCE ON THE PHOTORESPONSE [J].
DREINER, R ;
SCHIMMEL, J .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1964, 111 (04) :453-456
[4]  
FRANKLIN RW, 1961, C ANODIZING ALUMINIU, P96
[5]   APPLICATION OF ULTRAMICROTOMY TO ELECTRON-OPTICAL EXAMINATION OF SURFACE-FILMS ON ALUMINUM [J].
FURNEAUX, RC ;
THOMPSON, GE ;
WOOD, GC .
CORROSION SCIENCE, 1978, 18 (10) :853-&
[6]  
GUMINSKI RD, 1978, T I METAL FINISHING, V46, P44
[7]  
HARKNESS AC, 1969, CAN J CHEM, V44, P2409
[8]   A STUDY OF PITTING CORROSION OF A1 BY SCANNING ELECTRON MICROSCOPY [J].
RICHARDSON, JA ;
WOOD, GC .
CORROSION SCIENCE, 1970, 10 (05) :313-+
[9]   ANODIC FORMATION OF OXIDE FILMS ON SILICON [J].
SCHMIDT, PF ;
MICHEL, W .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1957, 104 (04) :230-236
[10]   THE DEVELOPMENT OF FLAWS CONTAINING GAMMA'-CRYSTALLINE ALUMINA REGIONS IN BARRIER ANODIC FILMS ON ALUMINUM [J].
SHIMIZU, K ;
TAJIMA, S ;
THOMPSON, GE ;
WOOD, GC .
ELECTROCHIMICA ACTA, 1980, 25 (11) :1481-1486