A SURVEY OF AGING OF ELECTRONICS WITH APPLICATION TO NUCLEAR-POWER PLANT INSTRUMENTATION

被引：10

作者：

JOHNSON, RT

THOME, FV

CRAFT, CM

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1983年 / 30卷 / 06期

关键词：

D O I：

10.1109/TNS.1983.4333137

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：4358 / 4362

页数：5

共 16 条

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[9]

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[10] COMPARISON OF RADIATION-DAMAGE OF ELECTRONIC COMPONENTS IRRADIATED IN DIFFERENT RADIATION-FIELDS [J].

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