ELECTRON HOLOGRAPHY .1. CAN ELECTRON HOLOGRAPHY REACH 0.1 NM RESOLUTION

被引：51

作者：

LICHTE, H

机构：

[1] Insitut für Angewandte Physik, Universität Tübingen

来源：

ULTRAMICROSCOPY | 1992年 / 47卷 / 1-3期

关键词：

D O I：

10.1016/0304-3991(92)90198-S

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The idea of solving many of the basic problems in electron microscopy by means of electron holography is straightforward. However, with the progress in experimental realization of electron holography at high resolution, severe difficulties show up. Presently, the major obstacle in reaching 0.1 nm resolution seems to be the imprecise knowledge about the aberrations of the microscope.

引用

页码：223 / 230

页数：8

共 11 条

[1] CORRECTION OF ABERRATIONS OF AN ELECTRON-MICROSCOPE BY MEANS OF ELECTRON HOLOGRAPHY
FU, Q
LICHTE, H
VOLKL, E
[J]. PHYSICAL REVIEW LETTERS, 1991, 67 (17) : 2319 - 2322
[2] A NEW MICROSCOPIC PRINCIPLE
GABOR, D
[J]. NATURE, 1948, 161 (4098) : 777 - 778
[3] OPTIMUM FOCUS FOR TAKING ELECTRON HOLOGRAMS
LICHTE, H
[J]. ULTRAMICROSCOPY, 1991, 38 (01) : 13 - 22
[4] ELECTRON HOLOGRAPHY APPROACHING ATOMIC RESOLUTION
LICHTE, H
[J]. ULTRAMICROSCOPY, 1986, 20 (03) : 293 - 304
[5] LICHTE H, 1991, ADV OPT ELECTRON MIC, V12, P25
[6] BEOBACHTUNGEN UND MESSUNGEN AN BIPRISMA-INTERFERENZEN MIT ELEKTRONENWELLEN
MOLLENSTEDT, G
DUKER, H
[J]. ZEITSCHRIFT FUR PHYSIK, 1956, 145 (03): : 377 - 397
[7] Rau W. D., 1991, Journal of Computer-Assisted Microscopy, V3, P51
[8] ROSE H, 1990, OPTIK, V85, P19
[9] ROSE H, 1971, OPTIK, V33, P1
[10] ELECTRON HOLOGRAMS FOR SUBANGSTROM POINT RESOLUTION
VOLKL, E
LICHTE, H
[J]. ULTRAMICROSCOPY, 1990, 32 (02) : 177 - 180

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