ELLIPSOMETRIC STUDY OF ANODIC OXIDE-GROWTH - APPLICATION TO THE TITANIUM-OXIDE SYSTEMS

被引:34
作者
JOSEPH, J
GAGNAIRE, A
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D O I
10.1016/0040-6090(83)90442-X
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T [工业技术];
学科分类号
08 ;
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页码:257 / 265
页数:9
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  • [1] ANODIC-OXIDATION OF TITANIUM IN SULFURIC SOLUTION - NATURE, THICKNESS AND REFRACTIVE-INDEX OF FILMS
    ARSOV, L
    FROELICHER, M
    FROMENT, M
    HUGOTLEGOFF, A
    [J]. JOURNAL DE CHIMIE PHYSIQUE ET DE PHYSICO-CHIMIE BIOLOGIQUE, 1975, 72 (03) : 275 - 279
  • [2] HIGH PRECISION SCANNING ELLIPSOMETER
    ASPNES, DE
    STUDNA, AA
    [J]. APPLIED OPTICS, 1975, 14 (01): : 220 - 228
  • [3] Azzam RMA, 1977, ELLIPSOMETRY POLARIZ
  • [4] SIMULTANEOUS DETERMINATION OF OPTICAL INDEXES OF AN ABSORBENT FILM AND ITS METALLIC SUBSTRATE BY STATISTICAL-ANALYSIS OF SPECTRO-REFLECTOMETRIC DATA - APPLICATION TO OXIDE-TITANIUM SYSTEM
    BLONDEAU, G
    FROELICHER, M
    FROMENT, M
    HUGOTLEGOFF, A
    [J]. THIN SOLID FILMS, 1976, 38 (03) : 261 - 270
  • [5] OPTICAL INDEXES OF OXIDE-FILMS AS A FUNCTION OF THEIR CRYSTALLIZATION - APPLICATION TO ANODIC TIO2 (ANATASE)
    BLONDEAU, G
    FROELICHER, M
    FROMENT, M
    HUGOTLEGOFF, A
    [J]. THIN SOLID FILMS, 1977, 42 (02) : 147 - 153
  • [6] OPTICAL-CONSTANTS OF TITANIUM
    CARROLL, JJ
    MELMED, AJ
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1974, 64 (04) : 514 - 515
  • [7] REVERSIBLE OPTICAL CHANGES WITHIN ANODIC OXIDE-FILMS ON TITANIUM AND NIOBIUM
    DYER, CK
    LEACH, JSL
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (01) : 23 - 29
  • [8] OPTICAL-CONSTANTS OF TRANSITION-METALS - TI, V, CR, MN, FE, CO, NI, AND PD
    JOHNSON, PB
    CHRISTY, RW
    [J]. PHYSICAL REVIEW B, 1974, 9 (12) : 5056 - 5070
  • [9] OPTICAL-PROPERTIES OF TI, ZR, AND HF FROM 0.15 TO 30 EV
    LYNCH, DW
    OLSON, CG
    WEAVER, JH
    [J]. PHYSICAL REVIEW B, 1975, 11 (10): : 3617 - 3624
  • [10] OPTICAL-PROPERTIES OF BULK TITANIUM AND THERMALLY GROWN OXIDE-FILMS ON TITANIUM USING ELLIPSOMETRY
    MUSA, AH
    NEAL, WEJ
    [J]. SURFACE TECHNOLOGY, 1980, 11 (05): : 323 - 332