SURFACE EXAFS MEASUREMENTS FROM SPECULAR REFLECTIVITY OF X-RAYS

被引：4

作者：

GURMAN, SJ

FOX, R

机构：

来源：

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1986年 / 54卷 / 02期

关键词：

D O I：

10.1080/13642818608239001

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：L45 / L49

页数：5

共 14 条

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