X-RAY-DIFFRACTION STUDIES OF THIN GOLD-FILMS USING VARIANCE METHOD

被引：4

作者：

LANGFORD, JI ^{[1
]}

TAPIA, J ^{[1
]}

机构：

[1] UNIV BIRMINGHAM,DEPT PHYS,BIRMINGHAM B15 2TT,ENGLAND

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1974年 / 7卷 / AUG1期

关键词：

D O I：

10.1107/S0021889874010053

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：421 / 426

页数：6

共 18 条

[1]

Edwards H. J., 1970, Journal of Applied Crystallography, V3, P165, DOI 10.1107/S0021889870005861

[2] COMPARISON BETWEEN VARIANCES OF CU K-ALPHA AND FE K-ALPHA SPECTRAL DISTRIBUTIONS [J].

EDWARDS, HJ ;

LANGFORD, JI .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (FEB1) :43-&

[3] PROFILE-ANALYSIS COMPUTER PROGRAM [J].

EDWARDS, HJ ;

TOMAN, K .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (AUG1) :332-&

[4] A VARIANCE ANALYSIS OF BROADENED X-RAY DIFFRACTION LINES FROM EVAPORATED THIN FILMS OF ALUMINIUM [J].

GRIMES, NW ;

PEARSON, JM ;

FANE, RW ;

NEAL, WEJ .

PHILOSOPHICAL MAGAZINE, 1970, 21 (169) :177-&

[5] VARIANCE AND OTHER MEASURES OF LINE BROADENING IN POWDER DIFFRACTOMETRY .2. DETERMINATION OF PARTICLE SIZE [J].

LANGFORD, JI .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1968, 1 :131-&

[6] VARIANCE AND OTHER MEASURES OF LINE BROADENING IN POWDER DIFFRACTOMETRY .I. PRACTICAL CONSIDERATIONS [J].

LANGFORD, JI .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1968, 1 :48-&

[7]

LANGFORD JI, 1963, CRYSTALLOGRAPHY CRYS

[8]

Maissel L.I., 1970, HDB THIN FILM TECHNO

[9] DETERMINATION OF PARTICLE SIZE + STRAIN IN DISTORTED POLYCRYSTALLINE AGGREGATE BY METHOD OF VARIANCE [J].

MITRA, GB .

ACTA CRYSTALLOGRAPHICA, 1964, 17 (06) :765-&

[10]

NEUGEBAUER CA, 1970, HDB THIN FILM TECHNO, pCH8

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