ON THE PROPERTIES OF ZNSE/(NH4)2SX-PRETREATED GAAS HETEROINTERFACES

被引:7
作者
OHNAKADO, T
WU, Y
KAWAKAMI, Y
FUJITA, S
FUJITA, S
机构
[1] Department of Electrical Engineering, Kyoto University, Kyoto
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1991年 / 30卷 / 08期
关键词
(NH4)2SX PRETREATMENT; MOMBE; ZNSE/GAAS; HETEROINTERFACE; INTERFACE STATE DENSITY;
D O I
10.1143/JJAP.30.1668
中图分类号
O59 [应用物理学];
学科分类号
摘要
(NH4)2S(x) pretreatment of a GaAs surface successfully resulted in high-quality ZnSe/GaAs heterointerfaces, which are attractive for applications to heterojunction devices as well as metal-insulator-semiconductor field-effect transistors (MISFETs). In order to overcome the problem of small conduction band offset, which is undesirable for MIS structures, we propose a slight addition of Mg and S to ZnSe, i.e., the ZnMgSSe/GaAs heterointerface.
引用
收藏
页码:1668 / 1669
页数:2
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