DOUBLE-CRYSTAL X-RAY TOPOGRAPHIC STUDIES OF BULK AND EPITAXIALLY GROWN ZNXCD1-XTE (0.0 LESS-THAN-OR-EQUAL-TO X LESS-THAN-OR-EQUAL-TO 0.06)

被引：12

作者：

QADRI, SB

FATEMI, M

DINAN, JH

机构：

[1] USN,RES LAB,WASHINGTON,DC 20375

[2] USA,NIGHT VIS & ELECTRO OPT LAB,FT BELVOIR,VA 22060

来源：

关键词：

D O I：

10.1063/1.96568

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：239 / 241

页数：3

共 16 条

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[6] LIQUID-PHASE EPITAXIAL-GROWTH OF LARGE AREA HG1-XCDXTE EPITAXIAL LAYERS
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[J]. JOURNAL OF APPLIED PHYSICS, 1984, 55 (06) : 1453 - 1460
[7] MBE GROWTH OF CDTE, HG1-XCDXTE, AND MULTILAYER STRUCTURES - ACHIEVEMENTS, PROBLEMS, AND PROSPECTS
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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (01): : 60 - 66
[8] MAGEE TJ, 1983, P IRIS INFRARED DETE, V1, P127
[9] X-RAY DETERMINATION OF DISLOCATION DENSITY IN EPITAXIAL ZNCDTE
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DINAN, JH
[J]. APPLIED PHYSICS LETTERS, 1985, 47 (10) : 1066 - 1068
[10] SCHWUTTKE GH, 1975, EPITAXIAL GROWTH, P281