共 31 条
- [1] CASHWELL HL, 1963, J APPL PHYS, V34, P3264
- [2] FRIEDMAN JF, 1962, IBM J, V6, P442
- [3] Electron diffraction studies of thin films - I - Structure of very thin films [J]. PHYSICAL REVIEW, 1939, 56 (01): : 58 - 71
- [4] X-RAY LINE BROADENING IN METALS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION A, 1949, 62 (359): : 741 - 743
- [5] THE CAUSE OF STRESS IN EVAPORATED METAL FILMS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1954, 67 (414): : 497 - 500
- [8] HOFFMAN RW, 1959, PHYS REV, V78, P349
- [9] HORIKOSHI H, 1963, J VAC SOC JAPAN, V6, P182
- [10] HORIKOSHI H, 1963, JPN J APPL PHYS, V2, P238