INTERNAL STRESS OF EVAPORATED THIN GOLD FILMS

[1] CASHWELL HL, 1963, J APPL PHYS, V34, P3264

[2] FRIEDMAN JF, 1962, IBM J, V6, P442

[3] Electron diffraction studies of thin films - I - Structure of very thin films [J]. PHYSICAL REVIEW, 1939, 56 (01): : 58 - 71

[4] X-RAY LINE BROADENING IN METALS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION A, 1949, 62 (359): : 741 - 743

[5] THE CAUSE OF STRESS IN EVAPORATED METAL FILMS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1954, 67 (414): : 497 - 500

[6] EVIDENCE FOR COLLAPSE OF LATTICE VACANCY AGGREGATES TO FORM DISLOCATION RINGS [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (02) : 231 - 232

[7] STRESS ANNEALING IN COPPER FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1956, 27 (02) : 193 - 193

[8] HOFFMAN RW, 1959, PHYS REV, V78, P349

[9] HORIKOSHI H, 1963, J VAC SOC JAPAN, V6, P182

[10] HORIKOSHI H, 1963, JPN J APPL PHYS, V2, P238

[1] CASHWELL HL, 1963, J APPL PHYS, V34, P3264

[2] FRIEDMAN JF, 1962, IBM J, V6, P442

[3] Electron diffraction studies of thin films - I - Structure of very thin films [J]. PHYSICAL REVIEW, 1939, 56 (01): : 58 - 71

[4] X-RAY LINE BROADENING IN METALS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION A, 1949, 62 (359): : 741 - 743

[5] THE CAUSE OF STRESS IN EVAPORATED METAL FILMS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1954, 67 (414): : 497 - 500

[6] EVIDENCE FOR COLLAPSE OF LATTICE VACANCY AGGREGATES TO FORM DISLOCATION RINGS [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (02) : 231 - 232

[7] STRESS ANNEALING IN COPPER FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1956, 27 (02) : 193 - 193

[8] HOFFMAN RW, 1959, PHYS REV, V78, P349

[9] HORIKOSHI H, 1963, J VAC SOC JAPAN, V6, P182

[10] HORIKOSHI H, 1963, JPN J APPL PHYS, V2, P238