AUTOMATIC EVALUATION OF OPTICAL-CONSTANTS AND THICKNESS OF THIN-FILMS - APPLICATION TO THIN DIELECTRIC LAYERS

被引：38

作者：

PELLETIER, E ^{[1
]}

ROCHE, P ^{[1
]}

VIDAL, B ^{[1
]}

机构：

[1] UNIV AIX MARSEILLE,CTR ETUD COUCHES MINCES,OPTIQUE LAB,F-13397 MARSEILLE 4,FRANCE

来源：

NOUVELLE REVUE D OPTIQUE | 1976年 / 7卷 / 06期

关键词：

D O I：

10.1088/0335-7368/7/6/301

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：353 / 362

页数：10

共 14 条

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