COMPUTATIONAL METHOD FOR DETERMINING N AND K FOR THIN FILM FROM MEASURED REFLECTANCE TRANSMITTANCE AND FILM THICKNESS

被引：90

作者：

BENNETT, JM

BOOTY, MJ

机构：

来源：

APPLIED OPTICS | 1966年 / 5卷 / 01期

关键词：

D O I：

10.1364/AO.5.000041

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：41 / &

共 10 条

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[4] INTRINSIC OPTICAL ABSORPTION IN SINGLE-CRYSTAL GERMANIUM AND SILICON AT 77-DEGREES-K AND 300-DEGREES-K
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[10] WOLF E, 1963, PROGRESS OPTICS, V2, P268