DYNAMICAL ANALYSIS OF LOW-ENERGY ELECTRON-DIFFRACTION INTENSITIES FROM INAS(110)

被引：28

作者：

DUKE, CB ^{[1
]}

PATON, A ^{[1
]}

KAHN, A ^{[1
]}

BONAPACE, CR ^{[1
]}

机构：

[1] PRINCETON UNIV,DEPT ELECT ENGN & COMP SCI,PRINCETON,NJ 08544

来源：

PHYSICAL REVIEW B | 1983年 / 27卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.27.6189

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：6189 / 6198

页数：10

共 31 条

[1] CHEMICAL AND ELECTRONIC-STRUCTURE OF COMPOUND SEMICONDUCTOR-METAL INTERFACES
BRILLSON, LJ
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (03): : 652 - 658
[2] Duke C.B., 1983, ADV CERAM, V4, P1
[3] Duke C.B., 1974, DYNAMIC ASPECTS SURF, P99
[4] Duke C.B., 1974, ADV CHEM PHYS, V27, P1
[5] ATOMIC GEOMETRY OF GASB(110) - DETERMINATION VIA ELASTIC LOW-ENERGY ELECTRON-DIFFRACTION INTENSITY ANALYSIS
DUKE, CB
PATON, A
KAHN, A
[J]. PHYSICAL REVIEW B, 1983, 27 (06): : 3436 - 3444
[6] STRUCTURE DETERMINATION FOR THE (110) SURFACE OF ZINCBLENDE STRUCTURE COMPOUND SEMICONDUCTORS
DUKE, CB
MEYER, RJ
PATON, A
MARK, P
KAHN, A
SO, E
YEH, JL
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05): : 1252 - 1257
[7] ATOMIC GEOMETRY OF CLEAVAGE SURFACES OF TETRAHEDRALLY COORDINATED COMPOUND SEMICONDUCTORS
DUKE, CB
LUBINSKY, AR
LEE, BW
MARK, P
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (04): : 761 - 768
[8] CALCULATIONS OF LOW-ENERGY ELECTRON-DIFFRACTION INTENSITIES FROM POLAR FACES OF ZNO
DUKE, CB
LUBINSKY, AR
[J]. SURFACE SCIENCE, 1975, 50 (02) : 605 - 614
[9] DYNAMICAL ANALYSIS OF LOW-ENERGY-ELECTRON-DIFFRACTION INTENSITIES FROM GAP(110)
DUKE, CB
PATON, A
FORD, WK
KAHN, A
CARELLI, J
[J]. PHYSICAL REVIEW B, 1981, 24 (02): : 562 - 573
[10] TRENDS IN SURFACE ATOMIC GEOMETRIES OF COMPOUND SEMICONDUCTORS
DUKE, CB
MEYER, RJ
MARK, P
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (05): : 971 - 977