REDUCED-PRESSURE MICROWAVE-INDUCED PLASMA MASS-SPECTROMETRIC DETECTION OF PHOSPHORUS AND SULFUR IN GAS-CHROMATOGRAPHIC ELUATES

被引：25

作者：

STORY, WC ^{[1
]}

OLSON, LK ^{[1
]}

SHEN, WL ^{[1
]}

CREED, JT ^{[1
]}

CARUSO, JA ^{[1
]}

机构：

[1] UNIV CINCINNATI,DEPT CHEM,CINCINNATI,OH 45221

来源：

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 1990年 / 5卷 / 06期

关键词：

Capillary gas chromatography; Phosphorus detection; Reduced-pressure helium microwave-induced plasma mass spectrometry; Reduced-pressure nitrogen microwave-induced plasma mass spectrometry; Sulphur detection;

D O I：

10.1039/ja9900500467

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

The determination of phosphorus and sulphur at trace levels is not possible by conventional atmospheric pressure plasma mass spectrometry because of high background signals at m/z= 31 (14N16OH + )and m/z= 32 (16O2 + ). The reduced-pressure plasmas decrease the background at the major isotopes of phosphorus and sulphur such that sub-nanogram detection is possible. The use of reduced-pressure helium and nitrogen microwave-induced plasmas for the determination of phosphorus and sulphur is discussed. With a helium plasma, the detection limit for phosphorus in triethyl phosphite ranges from 1 to 90 ng depending on the amount of torch cooling. Using a nitrogen plasma, sub-nanogram detection limits for phosphorus and sulphur in two organophosphorus pesticides were obtained.

引用

页码：467 / 470

页数：4

共 21 条

[1] LOW PRESSURE EMISSION SPECTROMETRIC DETERMINATION OF PART-PER-BILLION RESIDUE LEVELS OF ORGANOPHOSPHORUS INSECTICIDES [J].