FIELD-DESORPTION MICROSCOPY AND ATOM PROBE

被引：19

作者：

WAUGH, AR ^{[1
]}

BOYES, ED ^{[1
]}

SOUTHON, MJ ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,DEPT MET & MAT SCI,PEMBROKE ST,CAMBRIDGE CB2 3QZ,ENGLAND

来源：

NATURE | 1975年 / 253卷 / 5490期

关键词：

D O I：

10.1038/253342a0

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：342 / 343

页数：2

共 12 条

[1] CONSTRUCTION AND PERFORMANCE OF AN FIM-ATOM PROBE [J].

BRENNER, SS ;

MCKINNEY, JT .

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[2] FIM-ATOM PROBE ANALYSIS OF THIN NITRIDE PLATELETS IN FE-3 AT . PERCENT MO [J].

BRENNER, SS ;

GOODMAN, SR .

SCRIPTA METALLURGICA, 1971, 5 (10) :865-&

[3] INFLUENCE OF SURFACE COORDINATION ON FIELD EVAPORATION PROCESSES IN TUNGSTEN [J].

MOORE, AJW ;

SPINK, JA .

SURFACE SCIENCE, 1974, 44 (01) :198-212

[4] ATOM-PROBE FIELD ION MICROSCOPE [J].

MULLER, EW ;

PANITZ, JA ;

MCLANE, SB .

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[5]

MULLER EW, 1973, PROG SURF SCI, V4, P12

[6] 10 CM ATOM PROBE [J].

PANITZ, JA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (08) :1034-1038

[7] CRYSTALLOGRAPHIC DISTRIBUTION OF FIELD-DESORBED SPECIES [J].

PANITZ, JA .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01) :206-210

[8] USE OF A CHANNELLED IMAGE INTENSIFIER IN FIELD-ION MICROSCOPE [J].

TURNER, PJ ;

CARTWRIGHT, P ;

SOUTHON, MJ ;

VANOOSTR.A ;

MANLEY, BW .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08) :731-+

[9] FIELD-ION ATOM PROBE ANALYSIS [J].

TURNER, PJ ;

REGAN, BJ ;

SOUTHON, MJ .

SURFACE SCIENCE, 1973, 35 (01) :336-344

[10]

TURNER PJ, 1972, ADV ELECTRONICS EL B, V33, P1077

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