共 13 条
[1]
RELATION BETWEEN OPTICAL-SCATTERING, MICROSTRUCTURE AND TOPOGRAPHY OF THIN SILVER FILMS .1. OPTICAL-SCATTERING AND TOPOGRAPHY
[J].
APPLIED OPTICS,
1985, 24 (16)
:2701-2711
[3]
A STUDY OF GROWTH DEFECTS IN FACE-CENTRED CUBIC METAL FOILS PREPARED BY EVAPORATION
[J].
PHILOSOPHICAL MAGAZINE,
1959, 4 (45)
:1017-1029
[4]
A QUANTITATIVE ASSESSMENT OF THE CAPABILITIES OF 21/2D MICROSCOPY FOR ANALYZING CRYSTALLINE SOLIDS
[J].
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES,
1980, 42 (06)
:691-704
[7]
PENNEBAKER WB, 1968, IBM RC2105 RES REP
[10]
VOIDS IN THIN SILVER FILMS
[J].
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES,
1980, 41 (02)
:209-217