TIME-OF-FLIGHT ATOM-PROBE FIELD-ION MICROSCOPE FOR STUDY OF DEFECTS IN METALS

被引：24

作者：

HALL, TM

WAGNER, A

BERGER, AS

SEIDMAN, DN

机构：

[1] CORNELL UNIV,DEPT MAT SCI & ENGN,ITHACA,NY 14853

[2] CORNELL UNIV,CTR MAT SCI,ITHACA,NY 14853

来源：

SCRIPTA METALLURGICA | 1976年 / 10卷 / 05期

关键词：

D O I：

10.1016/0036-9748(76)90178-2

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

收藏

页码：485 / 488

页数：4

相关论文

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