HOLOGRAPHIC MEASUREMENT OF THE WAVE-ABERRATION OF AN ELECTRON-MICROSCOPE BY MEANS OF THE PHASES IN THE FOURIER SPECTRUM

被引:6
作者
FU, Q [1 ]
LICHTE, H [1 ]
机构
[1] UNIV TUBINGEN,INST ANGEW PHYS,AUF MORGANSTELLE 12,D-72076 TUBINGEN,GERMANY
来源
JOURNAL OF MICROSCOPY-OXFORD | 1995年 / 179卷
关键词
HOLOGRAPHY; ABERRATION CORRECTION; PHASE CONTRAST; ELECTRON MICROSCOPY; FOURIER SPECTRA;
D O I
10.1111/j.1365-2818.1995.tb03620.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
The resolution limit achievable by holographic correction of the aberrations of an electron microscope depends critically on the information available about the microscope parameters when the hologram was taken. The measuring technique based on symmetry relations of the phases in the Fourier spectrum of the reconstructed electron wave is outlined and experimentally tested.
引用
收藏
页码:112 / 118
页数:7
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