PHYSICAL CHARACTERIZATION AND MECHANISM OF CONDUCTION IN THIN-FILMS OF ALUMINUM FLUORIDE

被引：8

作者：

BARRIERE, A

DANTO, Y

SALARDENNE, J

机构：

来源：

THIN SOLID FILMS | 1975年 / 26卷 / 02期

关键词：

D O I：

10.1016/0040-6090(75)90142-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：273 / 291

页数：19

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