DETERMINATION OF RELATIVE ELECTRON INELASTIC MEAN FREE PATHS (ESCAPE DEPTHS) AND PHOTOIONISATION CROSS-SECTIONS BY X-RAY PHOTOELECTRON-SPECTROSCOPY

被引：34

作者：

CADMAN, P ^{[1
]}

EVANS, S ^{[1
]}

SCOTT, JD ^{[1
]}

THOMAS, JM ^{[1
]}

机构：

[1] UNIV COLL WALES,EDWARD DAVIES CHEM LABS,ABERYSTWYTH SY23 1NE,WALES

来源：

JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS II | 1975年 / 71卷

关键词：

D O I：

10.1039/f29757101777

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：1777 / 1784

页数：8

共 27 条

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[J]. PHYSICAL REVIEW B-SOLID STATE, 1972, 5 (03): : 1016 - +
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SWINGLE, RS
[J]. ANALYTICAL CHEMISTRY, 1975, 47 (01) : 21 - 24
[25] THOMAS JM, 1974, PROGR SURFACE MEMBRA, V8, P49
[26] SENSITIVITY OF DETECTION OF ELEMENTS BY PHOTOELECTRON SPECTROMETRY
WAGNER, CD
[J]. ANALYTICAL CHEMISTRY, 1972, 44 (06) : 1050 - &
[27] WEAST RC, 1973, HDB CHEMISTRY PHYSIC