共 15 条
[1]
BOHLAND JF, 1985, P SOC PHOTO-OPT INST, V539, P267, DOI 10.1117/12.947842
[2]
BUCKLEY JD, 1989, P SOC PHOTO-OPT INS, V1088, P424
[3]
CERNIGLIARO GJ, 1989, P SOC PHOTO-OPT INS, V1086, P106, DOI 10.1117/12.953023
[4]
Coane P., 1988, Proceedings of the SPIE - The International Society for Optical Engineering, V923, P236, DOI 10.1117/12.945656
[5]
COOPMANS F, 1986, SPIE P, V631, P34
[6]
DAS S, 1988, P MICROELECTRONICS S, P249
[7]
CHARACTERIZATION OF A HIGH-RESOLUTION NOVOLAK BASED NEGATIVE ELECTRON-BEAM RESIST WITH 4-MU-C/CM2 SENSITIVITY
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1988, 6 (01)
:379-383
[8]
MCDONALD SA, 1985, P SPE, P177
[9]
POL V, 1986, P SOC PHOTO-OPT INS, V633, P6
[10]
SCHELLEKENS JPW, 1989, P SPIE, V86, P220