STRUCTURE OF (SQUARE-ROOT-3 X SQUARE-ROOT-3) R30-DEGREES AG ON SI(111)

被引：54

作者：

BULLOCK, EL ^{[1
]}

HERMAN, GS ^{[1
]}

YAMADA, M ^{[1
]}

FRIEDMAN, DJ ^{[1
]}

FADLEY, CS ^{[1
]}

机构：

[1] UNIV HAWAII,DEPT CHEM,HONOLULU,HI 96822

来源：

PHYSICAL REVIEW B | 1990年 / 41卷 / 03期

关键词：

D O I：

10.1103/PhysRevB.41.1703

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The structure of (s3×s3)R30°Ag on Si(111) has been studied by polar and azimuthal x-ray photoelectron diffraction. We conclude from this data that the Ag cannot be more than 0.5 AIS below the surface, and furthermore from an R-factor analysis of the azimuthal results that the structure consists of two closely related types of Ag honeycomb domains that grow on the second Si layer, with the top Si layer missing. © 1990 The American Physical Society.

引用

页码：1703 / 1706

页数：4

共 27 条

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