OBSERVATION AND STRUCTURAL DETERMINATION OF (SQUARE-ROOT-3 X SQUARE-ROOT-3)R30-DEGREES RECONSTRUCTION OF THE SI(111) SURFACE

被引:52
作者
FAN, WC
IGNATIEV, A
HUANG, H
TONG, SY
机构
[1] UNIV HOUSTON,CTR SPACE VACUUM EPITAXY,HOUSTON,TX 77004
[2] UNIV WISCONSIN,DEPT PHYS,MILWAUKEE,WI 53201
[3] UNIV WISCONSIN,SURFACE STUDIES LAB,MILWAUKEE,WI 53201
[4] NATL SCI FDN,WASHINGTON,DC 20550
关键词
D O I
10.1103/PhysRevLett.62.1516
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:1516 / 1519
页数:4
相关论文
共 17 条
[1]   VACANCY-INDUCED 2X2 RECONSTRUCTION OF THE GA(111) SURFACE OF GAAS [J].
CHADI, DJ .
PHYSICAL REVIEW LETTERS, 1984, 52 (21) :1911-1914
[2]   THEORETICAL-STUDIES OF SI(111) SURFACE-STRUCTURES [J].
CHADI, DJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03) :856-859
[3]   ISLAND FORMATION OF ALUMINUM ON THE GRAPHITE (0001) SURFACE - LEED AND AES STUDY [J].
FAN, WC ;
STROZIER, J ;
IGNATIEV, A .
SURFACE SCIENCE, 1988, 195 (1-2) :226-236
[4]   ATOMIC GEOMETRY OF SI(111) 7X7 BY DYNAMICAL LOW-ENERGY ELECTRON-DIFFRACTION [J].
HUANG, H ;
TONG, SY ;
PACKARD, WE ;
WEBB, MB .
PHYSICS LETTERS A, 1988, 130 (03) :166-170
[5]   QUANTITATIVE STRUCTURAL DETERMINATION OF METALLIC FILM GROWTH ON A SEMICONDUCTOR CRYSTAL - (SQUARE-ROOT-3 X SQUARE-ROOT-3)R30-DEGREES-](1X1) PB ON GE(111) [J].
HUANG, H ;
WEI, CM ;
LI, H ;
TONNER, BP ;
TONG, SY .
PHYSICAL REVIEW LETTERS, 1989, 62 (05) :559-562
[6]   SURFACE-STRUCTURE ANALYSIS OF AU OVERLAYERS ON SI BY IMPACT-COLLISION ION-SCATTERING SPECTROSCOPY - SQUARE-ROOT-3X SQUARE-ROOT-3 AND 6X6 SI(111)/AU [J].
HUANG, JH ;
WILLIAMS, RS .
PHYSICAL REVIEW B, 1988, 38 (06) :4022-4032
[7]   GEOMETRIC STRUCTURE OF THE SI(111)SQUARE-ROOT-3SQUARE-ROOT-3-GA SURFACE [J].
KAWAZU, A ;
SAKAMA, H .
PHYSICAL REVIEW B, 1988, 37 (05) :2704-2706
[8]   STRUCTURAL PROPERTIES OF CLEAVED SILICON AND GERMANIUM SURFACES [J].
LANDER, JJ ;
GOBELL, GW ;
MORRISON, J .
JOURNAL OF APPLIED PHYSICS, 1963, 34 (08) :2298-+
[9]   EFFECTIVE CALCULATION OF LEED INTENSITIES USING SYMMETRY-ADAPTED FUNCTIONS [J].
MORITZ, W .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984, 17 (02) :353-362
[10]   SYMMETRIZATION AND CALCULATION OF LEED INTENSITY PATTERNS [J].
RUNDGREN, J ;
SALWEN, A .
COMPUTER PHYSICS COMMUNICATIONS, 1975, 9 (05) :312-326