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SCANNING TUNNELING MICROSCOPY OF A THIN-FILM OF PD2SI ON A SI(100) SUBSTRATE
被引:6
作者
:
BRUNNER, AJ
论文数:
0
引用数:
0
h-index:
0
BRUNNER, AJ
STEMMER, A
论文数:
0
引用数:
0
h-index:
0
STEMMER, A
ROSENTHALER, L
论文数:
0
引用数:
0
h-index:
0
ROSENTHALER, L
WIESENDANGER, R
论文数:
0
引用数:
0
h-index:
0
WIESENDANGER, R
RINGGER, M
论文数:
0
引用数:
0
h-index:
0
RINGGER, M
OELHAFEN, P
论文数:
0
引用数:
0
h-index:
0
OELHAFEN, P
RUDIN, H
论文数:
0
引用数:
0
h-index:
0
RUDIN, H
GUNTHERODT, HJ
论文数:
0
引用数:
0
h-index:
0
GUNTHERODT, HJ
机构
:
来源
:
SURFACE SCIENCE
|
1987年
/ 181卷
/ 1-2期
关键词
:
D O I
:
10.1016/0039-6028(87)90172-5
中图分类号
:
O64 [物理化学(理论化学)、化学物理学];
学科分类号
:
070304 ;
081704 ;
摘要
:
引用
收藏
页码:313 / 323
页数:11
相关论文
共 16 条
[1]
TUNNELING MICROSCOPY AND SPECTROSCOPY OF SEMICONDUCTOR SURFACES AND INTERFACES
BARATOFF, A
论文数:
0
引用数:
0
h-index:
0
BARATOFF, A
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
FUCHS, H
论文数:
0
引用数:
0
h-index:
0
FUCHS, H
SALVAN, F
论文数:
0
引用数:
0
h-index:
0
SALVAN, F
STOLL, E
论文数:
0
引用数:
0
h-index:
0
STOLL, E
[J].
SURFACE SCIENCE,
1986,
168
(1-3)
: 734
-
743
[2]
SCANNING TUNNELING MICROSCOPY
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
[J].
SURFACE SCIENCE,
1985,
152
(APR)
: 17
-
26
[3]
BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[4]
SCANNING TUNNELING MICROSCOPY
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
[J].
SURFACE SCIENCE,
1983,
126
(1-3)
: 236
-
244
[5]
SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
BINNING, G
论文数:
0
引用数:
0
h-index:
0
BINNING, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
GERBER, C
论文数:
0
引用数:
0
h-index:
0
GERBER, C
WEIBEL, E
论文数:
0
引用数:
0
h-index:
0
WEIBEL, E
[J].
PHYSICAL REVIEW LETTERS,
1982,
49
(01)
: 57
-
61
[6]
BRUNNER AJ, IN PRESS NUCL INST B
[7]
ROOM-TEMPERATURE OXIDATION OF NI, PD, AND PT SILICIDES
CROS, A
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
CROS, A
POLLAK, RA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
POLLAK, RA
TU, KN
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TU, KN
[J].
JOURNAL OF APPLIED PHYSICS,
1985,
57
(06)
: 2253
-
2257
[8]
SURFACE-MORPHOLOGY OF OXIDIZED AND ION-ETCHED SILICON BY SCANNING TUNNELING MICROSCOPY
FEENSTRA, RM
论文数:
0
引用数:
0
h-index:
0
FEENSTRA, RM
OEHRLEIN, GS
论文数:
0
引用数:
0
h-index:
0
OEHRLEIN, GS
[J].
APPLIED PHYSICS LETTERS,
1985,
47
(02)
: 97
-
99
[9]
SCANNING TUNNELING MICROSCOPY OF NANOCRYSTALLINE SILICON SURFACES
GIMZEWSKI, JK
论文数:
0
引用数:
0
h-index:
0
机构:
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
GIMZEWSKI, JK
HUMBERT, A
论文数:
0
引用数:
0
h-index:
0
机构:
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
HUMBERT, A
POHL, DW
论文数:
0
引用数:
0
h-index:
0
机构:
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
POHL, DW
VEPREK, S
论文数:
0
引用数:
0
h-index:
0
机构:
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
VEPREK, S
[J].
SURFACE SCIENCE,
1986,
168
(1-3)
: 795
-
800
[10]
SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE
HAMERS, RJ
论文数:
0
引用数:
0
h-index:
0
HAMERS, RJ
TROMP, RM
论文数:
0
引用数:
0
h-index:
0
TROMP, RM
DEMUTH, JE
论文数:
0
引用数:
0
h-index:
0
DEMUTH, JE
[J].
PHYSICAL REVIEW LETTERS,
1986,
56
(18)
: 1972
-
1975
←
1
2
→
共 16 条
[1]
TUNNELING MICROSCOPY AND SPECTROSCOPY OF SEMICONDUCTOR SURFACES AND INTERFACES
BARATOFF, A
论文数:
0
引用数:
0
h-index:
0
BARATOFF, A
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
FUCHS, H
论文数:
0
引用数:
0
h-index:
0
FUCHS, H
SALVAN, F
论文数:
0
引用数:
0
h-index:
0
SALVAN, F
STOLL, E
论文数:
0
引用数:
0
h-index:
0
STOLL, E
[J].
SURFACE SCIENCE,
1986,
168
(1-3)
: 734
-
743
[2]
SCANNING TUNNELING MICROSCOPY
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
[J].
SURFACE SCIENCE,
1985,
152
(APR)
: 17
-
26
[3]
BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[4]
SCANNING TUNNELING MICROSCOPY
BINNIG, G
论文数:
0
引用数:
0
h-index:
0
BINNIG, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
[J].
SURFACE SCIENCE,
1983,
126
(1-3)
: 236
-
244
[5]
SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
BINNING, G
论文数:
0
引用数:
0
h-index:
0
BINNING, G
ROHRER, H
论文数:
0
引用数:
0
h-index:
0
ROHRER, H
GERBER, C
论文数:
0
引用数:
0
h-index:
0
GERBER, C
WEIBEL, E
论文数:
0
引用数:
0
h-index:
0
WEIBEL, E
[J].
PHYSICAL REVIEW LETTERS,
1982,
49
(01)
: 57
-
61
[6]
BRUNNER AJ, IN PRESS NUCL INST B
[7]
ROOM-TEMPERATURE OXIDATION OF NI, PD, AND PT SILICIDES
CROS, A
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
CROS, A
POLLAK, RA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
POLLAK, RA
TU, KN
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TU, KN
[J].
JOURNAL OF APPLIED PHYSICS,
1985,
57
(06)
: 2253
-
2257
[8]
SURFACE-MORPHOLOGY OF OXIDIZED AND ION-ETCHED SILICON BY SCANNING TUNNELING MICROSCOPY
FEENSTRA, RM
论文数:
0
引用数:
0
h-index:
0
FEENSTRA, RM
OEHRLEIN, GS
论文数:
0
引用数:
0
h-index:
0
OEHRLEIN, GS
[J].
APPLIED PHYSICS LETTERS,
1985,
47
(02)
: 97
-
99
[9]
SCANNING TUNNELING MICROSCOPY OF NANOCRYSTALLINE SILICON SURFACES
GIMZEWSKI, JK
论文数:
0
引用数:
0
h-index:
0
机构:
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
GIMZEWSKI, JK
HUMBERT, A
论文数:
0
引用数:
0
h-index:
0
机构:
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
HUMBERT, A
POHL, DW
论文数:
0
引用数:
0
h-index:
0
机构:
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
POHL, DW
VEPREK, S
论文数:
0
引用数:
0
h-index:
0
机构:
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
INST INORGAN CHEM,CH-8057 ZURICH,SWITZERLAND
VEPREK, S
[J].
SURFACE SCIENCE,
1986,
168
(1-3)
: 795
-
800
[10]
SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE
HAMERS, RJ
论文数:
0
引用数:
0
h-index:
0
HAMERS, RJ
TROMP, RM
论文数:
0
引用数:
0
h-index:
0
TROMP, RM
DEMUTH, JE
论文数:
0
引用数:
0
h-index:
0
DEMUTH, JE
[J].
PHYSICAL REVIEW LETTERS,
1986,
56
(18)
: 1972
-
1975
←
1
2
→