THE EFFECT OF APPLIED FREQUENCIES AND MULTIPLE FIRING ON THE RESISTANCE OF THICK-FILM RESISTORS

被引:7
作者
CHIOU, BS
HSU, WY
DUH, JG
机构
[1] NATL TSING HUA UNIV,DEPT MAT SCI & ENGN,HSINCHU 300,TAIWAN
[2] NATL CHIAO TUNG UNIV,INST ELECTR,HSINCHU 300,TAIWAN
来源
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 1992年 / 15卷 / 03期
关键词
D O I
10.1109/33.148508
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The resistance and impedance as a function of frequency for Dupont 1600 series thick film resistors are investigated. There exists an abrupt decrease in the resistance around 1 MHz. An equivalent circuit model is proposed to explain the high frequency behavior in the resistor. After multiple times of firing, the resistance is altered and the relative change is related to the intrinsic-resistance in the resistor. It is argued that the resistance variation is associated with the microstructure evolution of the resistor, in which the rearrangement of conducting grains in the glass matrix plays a major role.
引用
收藏
页码:393 / 396
页数:4
相关论文
共 7 条
[1]   CARRIER TRANSPORT THROUGH GRAIN-BOUNDARIES IN SEMICONDUCTORS [J].
BLATTER, G ;
GREUTER, F .
PHYSICAL REVIEW B, 1986, 33 (06) :3952-3966
[2]  
CHIOU BS, IN PRESS ADMITTANCE
[3]  
CHITALE SM, 1988, IEEE T COMPON HYBR, V11, P604, DOI 10.1109/33.16704
[4]   ELECTRICAL-PROPERTIES AND CONDUCTION MECHANISMS OF RUBASED THICK-FILM (CERMET) RESISTORS [J].
PIKE, GE ;
SEAGER, CH .
JOURNAL OF APPLIED PHYSICS, 1977, 48 (12) :5152-5169
[5]  
SARMA DHR, 1986, J AM CERAM SOC, V68, pC215
[6]  
VEST RW, 1975, DAHC1570G7 TECH REP
[7]   MICROSTRUCTURE DEVELOPMENT IN RUO2-GLASS THICK-FILM RESISTORS AND ITS EFFECT ON THE ELECTRICAL-RESISTIVITY [J].
YAMAGUCHI, T ;
IIZUKA, K .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1990, 73 (07) :1953-1957