PHOTOREFLECTANCE AND ELECTROREFLECTANCE SPECTRA FROM SPATIALLY INHOMOGENEOUS HETEROSTRUCTURES CALCULATED BY MEANS OF A NEW METHOD

被引:6
作者
BELIAEV, D
ENDERLEIN, R
SOARES, JANT
SCOLFARO, LMR
CESCHIN, AM
QUIVY, AA
LEITE, JR
机构
[1] Instituto de Física da Universidade de São Paulo, 01452-990 São Paulo, SP
关键词
D O I
10.1006/spmi.1994.1066
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The problem of calculating photo- and electro-reflectance spectra from weakly inhomogeneous layers of semiconductor heterostructures is solved by combining two former approaches; the transfer matrix method and the perturbation theoretical treatment of the weak inhomogeneity. The electric field profile and its perturbation by pump light is calculated from an integral equation. The method is applied to several heterostructures based on (Ga,Al)As. Due to its speed and accuracy the method is capable of online simulation of PR and ER spectra.
引用
收藏
页码:339 / 343
页数:5
相关论文
共 9 条
[1]   INFLUENCE OF SPATIALLY DEPENDENT PERTURBATIONS ON MODULATED REFLECTANCE AND ABSORPTION OF SOLIDS [J].
ASPNES, DE ;
FROVA, A .
SOLID STATE COMMUNICATIONS, 1969, 7 (01) :155-159
[2]  
ASPNES DE, 1967, PHYS REV, V153, P973
[3]  
ASPNES DE, 1986, J APPL PHYS, V50, P754
[4]   A FRANZ-KELDYSH MODEL FOR PHOTOREFLECTANCE FROM GAAS/GAALAS HETEROJUNCTION STRUCTURES [J].
BATCHELOR, RA ;
HAMNETT, A .
JOURNAL OF APPLIED PHYSICS, 1992, 71 (05) :2414-2422
[5]   FIELD-INHOMOGENEITY-INDUCED LINESHAPE ROTATION OBSERVED IN ROOM-TEMPERATURE ELECTROREFLECTANCE SPECTRA OF GAAS [J].
BEHN, U ;
ROPPISCHER, H .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1988, 21 (32) :5507-5519
[6]  
Born M., 1964, PRINCIPLES OPTICS
[7]  
ENDERLEIN R, 1992, 20TH P INT C PHYS SE, P1076
[8]   ACCURATE METHODS FOR SIMULATING ELECTROREFLECTANCE AND PHOTOREFLECTANCE SPECTRA OF GAAS [J].
JACKSON, PL ;
SEEBAUER, EG .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :943-948
[9]   PHOTOREFLECTANCE OF ALXGA1-XAS AND ALXGA1-XAS/GAAS INTERFACES AND HIGH-ELECTRON-MOBILITY TRANSISTORS [J].
SYDOR, M ;
JAHREN, N ;
MITCHEL, WC ;
LAMPERT, WV ;
HAAS, TW ;
YEN, MY ;
MUDARE, SM ;
TOMICH, DH .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (12) :7423-7429