FORMATION OF DIAMOND FILMS BY INTERMITTENT DISCHARGE PLASMA CHEMICAL-VAPOR-DEPOSITION

被引:16
作者
NODA, M [1 ]
KUSAKABE, H [1 ]
TANIGUCHI, K [1 ]
MARUNO, S [1 ]
机构
[1] NAGOYA INST TECHNOL,DEPT ELECT & COMP ENGN,NAGOYA,AICHI 466,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1994年 / 33卷 / 7B期
关键词
DIAMOND FILM; PLASMA CVD; INTERMITTENT DISCHARGE; MICROSTRUCTURE; LANGMUIR PROBE;
D O I
10.1143/JJAP.33.4400
中图分类号
O59 [应用物理学];
学科分类号
摘要
Formation of diamond film by DC plasma chemical vapor deposition (CVD), wherein the waveform of the power supply is half-wave-rectified (HWR), has been investigated. When HWR voltage is applied to the electrodes, the waveforms of the discharge voltage (V-d) and current (I-d) are intermittent and show a large peak at the beginning of the discharge. The films deposited by intermittent discharge (ID) are superior in crystalline quality compared with that by conventional continuous discharge (CD). The average value of electron temperature (T-c) in ID, measured by a Langmuir probe (LP) in the plasma of hydrogen gas, is higher than that of CD. The LP current shows a very high peak at the beginning of the ID process, and the value of T-c and density of electrons (N-c) at this peak are very large. These rises in T-c by ID are effective in enhancing the dissociation of the source gas by electron collision. It has been concluded from the present study that ID is an effectual method to obtain high-quality diamond film.
引用
收藏
页码:4400 / 4403
页数:4
相关论文
共 18 条
[1]   MODELING STUDIES OF AMORPHOUS-CARBON [J].
BEEMAN, D ;
SILVERMAN, J ;
LYNDS, R ;
ANDERSON, MR .
PHYSICAL REVIEW B, 1984, 30 (02) :870-875
[2]  
HERSHKOWITZ N, 1989, PLASMA DIAGNOSTICS, V1, P118
[3]  
Ichikawa Y., 1992, Oyo Buturi, V61, P1039
[4]   DIAMOND DEPOSITION ON SILICON SURFACES HEATED TO TEMPERATURE AS LOW AS 135-DEGREES-C [J].
IHARA, M ;
MAENO, H ;
MIYAMOTO, K ;
KOMIYAMA, H .
APPLIED PHYSICS LETTERS, 1991, 59 (12) :1473-1475
[5]  
Inuzuka T., 1986, Oyo Buturi, V55, P640
[6]  
KAWARADA H, 1988, OYO BUTURI, V57, P1912
[7]   EFFECT OF OXYGEN IN DIAMOND DEPOSITION AT LOW SUBSTRATE TEMPERATURES [J].
LIOU, Y ;
WEIMER, R ;
KNIGHT, D ;
MESSIER, R .
APPLIED PHYSICS LETTERS, 1990, 56 (05) :437-439
[8]  
MARUNO S, 1990, NEW CERAMICS, V3, P54
[9]   EFFECT OF DISCHARGE CURRENT ON THE MICROSTRUCTURE OF DIAMOND FILMS DEPOSITED ON ALUMINUM SUBSTRATE AT LOW SUBSTRATE-TEMPERATURE BY DC PLASMA CVD [J].
NAKAO, S ;
NODA, M ;
WATATANI, H ;
MARUNO, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1991, 30 (1A) :L45-L48
[10]   HYDROGEN-ETCHING EFFECT OF SUBSTRATE ON DEPOSITION OF DIAMOND FILMS BY DC PLASMA CHEMICAL VAPOR-DEPOSITION [J].
NAKAO, S ;
NODA, M ;
WATATANI, H ;
MARUNO, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1991, 30 (7A) :L1195-L1198