HYDROGEN-ETCHING EFFECT OF SUBSTRATE ON DEPOSITION OF DIAMOND FILMS BY DC PLASMA CHEMICAL VAPOR-DEPOSITION

被引:8
作者
NAKAO, S
NODA, M
WATATANI, H
MARUNO, S
机构
[1] AICHI UNIV EDUC, DEPT INTEGRATED SCI, KARIYA, AICHI 448, JAPAN
[2] NAGOYA INST TECHNOL, DEPT ELECT & COMP ENGN, SHOWA KU, NAGOYA, AICHI 466, JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1991年 / 30卷 / 7A期
关键词
DIAMOND FILM; HYDROGEN ETCHING; SI OXIDE SURFACE LAYER; DC PLASMA CVD; CH4; CONCENTRATION;
D O I
10.1143/JJAP.30.L1195
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effect of hydrogen plasma etching (HPE) of a Si substrate on the morphology and the quality of the diamond films deposited by DC plasma chemical vapor deposition in CH-4-H-2 mixture gas have been studied. It has been found that the HPE treatment before diamond deposition results in the modification of the substrate surface through the removal of the Si oxide layer and the formation of an uneven surface, and enhances the nucleation and growth of diamond. The amorphous component contained within the deposited films decreases through the use of the etched substrate, especially when the CH4 concentration is higher than 3%.
引用
收藏
页码:L1195 / L1198
页数:4
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